S-4-F-7-G

Contact Probe; Connector Type: Test Point; Contact Material: Beryllium Copper; Series: S; Contact Plating: Gold;...

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About S-4-F-7-G

The Interconnect Devices S-4-F-7-G Test Equipment datasheet provides detailed technical specifications, pinout information, and operating characteristics. This component: Contact Probe; Connector Type: Test Point; Contact Material: Beryllium Copper; Series: S; Contact Plating: Gold;.... Key parameters include Contact Material: Copper, Contact Plating: Gold, Current Rating: 5A, Length: 33.78mm, and Mount: PCB. S-4-F-7-G is manufactured by Interconnect Devices as part of their Test Equipment product line. On this page you can view and download the PDF datasheet, check specifications, and find similar components.

Specifications

Manufacturer
Interconnect Devices
Category
Test Equipment

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Parameters

Contact MaterialCopper
Contact PlatingGold
Current Rating5A
Length33.78mm
MountPCB
Reach SVHC CompliantUnknown
RoHSCompliant
SeriesS
TypeGeneral Purpose