S-4-E-5-G
Spring Contact Probe; Connector Type: Test Point; Contact Material: Beryllium Copper; Series: S; Contact Plating:...
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About S-4-E-5-G
The Interconnect Devices S-4-E-5-G Test Equipment datasheet provides detailed technical specifications, pinout information, and operating characteristics. This component: Spring Contact Probe; Connector Type: Test Point; Contact Material: Beryllium Copper; Series: S; Contact Plating:.... Key parameters include Contact Plating: Gold, Current Rating: 5A, Length: 33.78mm, Mount: PCB, and Reach SVHC Compliant: Unknown. S-4-E-5-G is manufactured by Interconnect Devices as part of their Test Equipment product line. On this page you can view and download the PDF datasheet, check specifications, and find similar components.
Specifications
- Manufacturer
- Interconnect Devices
- Category
- Test Equipment
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Parameters
| Contact Plating | Gold |
| Current Rating | 5A |
| Length | 33.78mm |
| Mount | PCB |
| Reach SVHC Compliant | Unknown |
| RoHS | Compliant |