S-4-C-5-G

Contact Probe; Connector Type: Test Point; Contact Material: Beryllium Copper; Series: S; Contact Plating: Gold ;...

No preview available

Download the PDF to view the complete datasheet

Similar Components

SH-4-H-10-G

INTERCONNECT DEVICES SH-4-H-10-G SPRING CONTACT PROBE, PCB

Interconnect DevicesTest Equipment
38 15

ICT-075-B-5-G

INTERCONNECT DEVICES ICT-075-B-5-G TEST POINT, 3A

Interconnect DevicesTest Equipment
34 4

S-4-H-7-G

INTERCONNECT DEVICES S-4-H-7-G SPRING CONTACT PROBE, PCB

Interconnect DevicesTest Equipment
37 19

GSS-18-7-G

0.100 INCH CENTERLINE SPACING SPRING CONTACT PROBE WAFFLE

Interconnect DevicesTest Equipment
35 5

SH-100-H-4-G

INTERCONNECT DEVICES SH-100-H-4-G SH SERIES TEST PROBE

Interconnect DevicesTest Equipment
39 3

S-2-H-4-GS/C

SPRING CONTACT PROBE

Interconnect DevicesTest Equipment
44 5

About S-4-C-5-G

The Interconnect Devices S-4-C-5-G Test Equipment datasheet provides detailed technical specifications, pinout information, and operating characteristics. This component: Contact Probe; Connector Type: Test Point; Contact Material: Beryllium Copper; Series: S; Contact Plating: Gold ;.... Key parameters include Contact Material: Copper, Contact Plating: Gold, Current Rating: 5A, Length: 33.78mm, and Mount: PCB. S-4-C-5-G is manufactured by Interconnect Devices as part of their Test Equipment product line. On this page you can view and download the PDF datasheet, check specifications, and find similar components.

Specifications

Manufacturer
Interconnect Devices
Category
Test Equipment

Ask AI Assistant

Ask questions about S-4-C-5-G specifications

AI Powered

Click to ask a quick question:

Parameters

Contact MaterialCopper
Contact PlatingGold
Current Rating5A
Length33.78mm
MountPCB
Reach SVHC CompliantUnknown
RoHSCompliant