S-3-E-4-G
Test Spring Probe; Connector Type: Test Point; Contact Material: Nickel; Series: S; Contact Plating: Gold; Leaded...
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About S-3-E-4-G
The Interconnect Devices S-3-E-4-G Test Equipment datasheet provides detailed technical specifications, pinout information, and operating characteristics. This component: Test Spring Probe; Connector Type: Test Point; Contact Material: Nickel; Series: S; Contact Plating: Gold; Leaded.... Key parameters include Contact Material: Nickel, Contact Plating: Gold, Current Rating: 5A, Length: 33.27mm, and Mount: PCB. S-3-E-4-G is manufactured by Interconnect Devices as part of their Test Equipment product line. On this page you can view and download the PDF datasheet, check specifications, and find similar components.
Specifications
- Manufacturer
- Interconnect Devices
- Category
- Test Equipment
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Parameters
| Contact Material | Nickel |
| Contact Plating | Gold |
| Current Rating | 5A |
| Length | 33.27mm |
| Mount | PCB |
| RoHS | Compliant |