S-3-B-4-G

Test Spring Probe; Connector Type: Test Point; Contact Material: Nickel; Series: S; Contact Plating: Gold; Leaded...

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About S-3-B-4-G

The Interconnect Devices S-3-B-4-G Test Equipment datasheet provides detailed technical specifications, pinout information, and operating characteristics. This component: Test Spring Probe; Connector Type: Test Point; Contact Material: Nickel; Series: S; Contact Plating: Gold; Leaded.... Key parameters include Contact Material: Nickel, Contact Plating: Gold, Current Rating: 5A, Diameter: 1.7mm, and Length: 33.27mm. S-3-B-4-G is manufactured by Interconnect Devices as part of their Test Equipment product line. On this page you can view and download the PDF datasheet, check specifications, and find similar components.

Specifications

Manufacturer
Interconnect Devices
Category
Test Equipment

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Parameters

Contact MaterialNickel
Contact PlatingGold
Current Rating5A
Diameter1.7mm
Length33.27mm
MountPCB
RoHSCompliant
TypeGeneral Purpose