S-2-F-4-G

Contact Probe; Connector Type: Test Point; Contact Material: Beryllium Copper; Series: S; Contact Plating: Gold ;...

No preview available

Download the PDF to view the complete datasheet

Similar Components

GSS-18-7-G

0.100 INCH CENTERLINE SPACING SPRING CONTACT PROBE WAFFLE

Interconnect DevicesTest Equipment
35 5

100891-002-922

INTERCONNECT DEVICES - 100891-002-922 - TERMINAL, 5A

Interconnect DevicesTest Equipment
38 1

S-4-H-7-G

INTERCONNECT DEVICES S-4-H-7-G SPRING CONTACT PROBE, PCB

Interconnect DevicesTest Equipment
37 19

101050-003

INTERCONNECT DEVICES 101050-003 PROBE, TEST, PCB

Interconnect DevicesTest Equipment
35 4

SH-4-H-10-G

INTERCONNECT DEVICES SH-4-H-10-G SPRING CONTACT PROBE, PCB

Interconnect DevicesTest Equipment
38 15

ICT-100-B-8-G-S

INTERCONNECT DEVICES ICT-100-B-8-G-S SPRING CONTACT PROBE

Interconnect DevicesTest Equipment
34 6

About S-2-F-4-G

The Interconnect Devices S-2-F-4-G Test Equipment datasheet provides detailed technical specifications, pinout information, and operating characteristics. This component: Contact Probe; Connector Type: Test Point; Contact Material: Beryllium Copper; Series: S; Contact Plating: Gold ;.... Key parameters include Contact Material: Copper, Contact Plating: Gold, Current Rating: 3A, Length: 24.64mm, and Mount: PCB. S-2-F-4-G is manufactured by Interconnect Devices as part of their Test Equipment product line. On this page you can view and download the PDF datasheet, check specifications, and find similar components.

Specifications

Manufacturer
Interconnect Devices
Category
Test Equipment

Ask AI Assistant

Ask questions about S-2-F-4-G specifications

AI Powered

Click to ask a quick question:

Parameters

Contact MaterialCopper
Contact PlatingGold
Current Rating3A
Length24.64mm
MountPCB
RoHSNot Compliant
RoHS CompliantNo